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2018 IEEE INTERNATIONAL WORKSHOP ON
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Metrology for Industry 4.0 & IoT
BRESCIA, ITALY | APRIL 16 - 18, 2018
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2018 IEEE INTERNATIONAL WORKSHOP ON
Metrology for Industry 4.0 & IoT
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Measurement Systems in the Industrial IoT Era


ORGANIZED BY

brandao

Dennis Brandão

Universidade de São Paulo, Brazil


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Emiliano Sisinni

University of Brescia, Italy


ABSTRACT

The Internet of Things There is pushing in the market toward a continuous improvement in terms of new devices, scalable systems and analysis algorithms. In particular, measurements systems are going to benefit of this new evolution, which opens new scenarios in all application sectors thanks to the increased connectivity and virtually unlimited bandwidth. This is also true in the industrial domain, and although there are similarities between IoT for general systems and industrial systems, (e.g. scalability) there are also significant differences because industrial systems must have low latencies, critical missions, high predictability and resilience to failures. Hence, there is justification for specific measurement systems for Industrial IoT applications (industrial Internet, Industry 4.0). The session will bring together all the innovative ideas and technologies about measurement challenges in the Industrial IoT era, ranging from system architecture, uncertainty analysis and applications with the aim of increasing the efficiency of industrial processes in terms of cost, productivity, and predictive maintenance. Submissions are welcomed on (but not limited to):

  • Distributed measurement systems based on Industrial IoT infrastructure
  • Architectures for robust and predictable measurement systems in Industrial IoT applications.
  • Uncertainty propagation in measurement systems for Industrial IoT.
  • IoT wireless technologies applied to industrial measurement system
  • Inclusion of heterogeneous network technologies (e.g. traditional industrial fieldbus) into IoT based measurement systems.
  • Fault tolerant measurement systems based on IoT paradigms for industrial application
  • Security of measurement systems of industrial application with IoT enabled interfaces
  • Enabling of predictive maintenance by means of IoT based measurement systems
  • Efficient design and implementation of virtual measurement systems in terms of the timing and uncertainty constrains.
  • Allocation of measurement tasks and algorithms at different infrastructure levels ranging from edge to cloud.
  • Increasing of the effectiveness of measurement result presentation by means of cloud based infrastructure.
  • Supporting service level virtualization for distributed measurement systems in industrial context.
  • Case studies of Industrial IoT measurement systems.


ABOUT THE ORGANIZERS

Dennis Brandão graduate at Engenharia Mecânica from Universidade de São Paulo (1998), master's at Mechanical Engineering from Universidade de São Paulo (2000) and ph.d. at Mechanical Engineering from Universidade de São Paulo (2005). Currently, he is associate professor at the Departamento de Engenharia Elétrica, Escola de Engenharia de São Carlos, Universidade de São Paulo . He has experience in Mechanical Engineering, acting on the following subjects: automação industrial, fieldbus foundation, wireless sensors, profibus and Real Time Ethernet fieldbus.


Emiliano Sisinni obtained the M.Sc. degree in electronic engineering in 2000 at the University of Brescia. In 2004, he got the Ph.D. in “Electronic Instrumentation” at the same University. He is currently an Associate Professor with the Department of Information Engineering at the University of Brescia. He was guest professor at Mid Sweden University for the AY2016/2017. His main research topic is the development and the performance evaluation of digital networks for industrial communications, with particular attention to wireless solutions. He has also been involved in the development of digital signal processing of sensory data based on microcontrollers, DSPs and FPGAs. Since 2008 he seats in the committee SC65C - WG16 and WG17 and the TC65C - WG 17 of the IEC (International Electrotechnical Commission).



With the Patronage of

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unisannio
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In Collaboration with

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