Best Conference Paper Award
Description: To recognize the most outstanding paper presented at the annual IEEE International Workshop on Metrology for Industry 4.0 and IoT.
Basis for Judging: Technical merit, originality, potential impact on the field, clarity of the written paper, and quality of the oral or other presentation.
Best Paper Presented by a Woman
Description: An exclusive plaque will be given for the best paper authored and presented by a woman.
Basis for Judging: Technical merit, originality, potential impact on the field, clarity of the written paper, and quality of the oral or other presentation.
Best Paper Presented by a Young Researcher
Description: An exclusive plaque will be given for the best paper authored and presented by a researcher younger than 35 years in age.
Basis for Judging: Technical merit, originality, potential impact on the field, clarity of the written paper, and quality of the oral or other presentation.
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